This book provides a complete set of educational models describing the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. It is both a professional reference and an advanced-level text, beginning with basics and moving on to the latest techniques, experiments, and theory.
The second edition features not only an accompanying CD-ROM with Mathematica
code for all the examples, but also a new applications section, reflecting the many recent breakthroughs in the field.
Introduction | Uniform Cantilevers | Cantilever Conversion Tables | V-Shaped Cantilevers | Tip-Sample Adhesion | Tip-Sample Force Curve | Free Vibrations | Noncontact Mode | Tapping Mode | Metal-Insulator-Metal Tunneling | Fowler-Nordheim Tunneling | Scanning Tunnel Spectroscopy | Coulomb Blockade | Density of States | Electrostatics | Near-Field Optics | Constriction and Boundary Resistance | Scanning Thermal Conductivity Microscopy | Kelvin Probe Force Microscopy | Raman Scattering in Nanocrystals